Sinton Instruments logoIndustry Leading Technology for Silicon PV Process Control
<empty>
  About Sinton Instruments
Sinton Instruments Products
Frequently asked questions
Sinton Instruments publications
Contact Us
gradient at bottom of navigation buttons

   
   
   
   
   
   
  Commonly Cited Suns-Voc Papers

<empty>
<empty>
yellow square
M. Wolf, and H. Rauschenbach, "Series Resistance Effects on Solar Cell Measurements," Advanced Energy Conversion, vol. 3, pp. 455-479, 1963. download PDF of paper (2.5 MB)
<empty>

The classic reference for using illumination-Voc curves for the analysis of solar cells.
<empty>
thin gray line
<empty>
<empty>
yellow square
A.G. Aberle, S.R. Wenham, and M.A. Green, "A New Method for the Accurate Measurements of the Lumped Series Resistance of Solar Cells," Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference, pp. 133-138, 1993.
<empty>
Describes using series resistance measurements on modern high-efficiency devices and an explanation of two-dimensional effects.
<empty>
thin gray line
<empty>
<empty>
yellow square
R. A. Sinton, "Possibilities for Process-Control Monitoring of Electronic Material Properties During Solar Cell Manufacture," NREL 9th Workshop on Crystalline Silicon Solar Cells and Materials and Processes, Aug 1999.
<empty>
Covers the practical use of SunsVoc and lifetime testers at various stages during cell processing.

<empty>
thin gray line
<empty>
<empty>
yellow square
R.A. Sinton, and A. Cuevas, "A Quasi-Steady-State Open-Circuit Voltage Method for Solar Cell Characterization," 16th European Photovoltaic Solar Energy Conference, 2000. download PDF of paper (861 KB)
<empty>
The first major reference for the QSSVOC technique.

<empty>
thin gray line
<empty>

<empty>
yellow square
S. Bowden, and A. Rohatgi, "Rapid and Accurate Determination of Series Resistance and Fill Factor Losses in Industrial Silicon Solar Cells," 17th European Photovoltaic Solar Energy Conference, pp. 1802-1806, Oct 2001.
<empty>
Comparison of the Suns-Voc method with curve fitting the double diode model.
<empty>
thin gray line
<empty>
<empty>
yellow square
M.J. Kerr, and A. Cuevas, "Generalisation of the illumination intensity vs. open-circuit voltage characteristics of solar cells," 17th European Photovoltaic Solar Energy Conference, pp. 300-303, Oct 2001.
<empty>
Description of the SunsVoc measurement and correction for very high voltage devices.
<empty>
thin gray line
<empty>
<empty>
yellow square
M.J. Kerr, A. Cuevas, and R.A. Sinton, "Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements," Journal of Applied Physics, vol. 91, no. 1, pp. 399-404, Jan 2002.
<empty>
Generalization of QSSVOC math to cover cases from Steady-state to OCVD (transient) measurements.
<empty>
thin gray line
<empty>
<empty>
yellow square
D.H. Neuhaus, N.P. Harder, S. Oelting, et al., "Dependence of the recombination in thin-film Si solar cells grown by ion-assisted deposition on the crystallographic orientation of the substrate," Solar Energy Materials and Solar Cells, vol. 74, pp. 225-232, Oct. 2002.
<empty>
thin gray line
<empty>
<empty>
yellow square

M.J. Kerr, and A. Cuevas, "Generalized analysis of the illumination intensity vs. open-circuit voltage of solar cells," Solar Energy, vol. 76, no. 1-4, pp. 263-267, Jan.-Mar. 2004.
<empty>
Complete mathematical description of the SunsVoc measurement and correction for very high voltage devices.
<empty>
thin gray line
<empty>
<empty>
back to top

<empty>

yellow square Copyright Notice
thin yellow line
<empty>
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
<empty>
For articles published by the IEEE: ©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

<empty>


 
Commonly cited Lifetime Tester papers
<empty>
Complete literature list
(PDF/252k)
<empty> <empty>
Add a reference
<empty> <empty>
Application notes
<empty> <empty>
 
 
     
     
           
      home<empty> | <empty>about<empty> | <empty>products<empty> | <empty>FAQs<empty> | <empty>publications<empty> | <empty>contact us  
           
      © 2009-2014 Sinton Consulting Inc. DBA Sinton Instruments<empty> | <empty>Website design: McHale Creative    
<empty> <empty> <empty> <empty> <empty>
Sinton logo link to home page