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The WCT-120 is an affordable, tabletop silicon lifetime and wafer metrology system, suitable for both device research and industrial process control description of WCT-120
 
WCT-120 — The Standard Offline Wafer-Lifetime Tool

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photo of WCT-120 instrument

The wafer measurement instrument offering the best available calibrated analysis of carrier recombination lifetime. Fully compliant with SEMI Standard PV-13.
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Product Overview
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WCT-120 instruments showcase our unique measurement and analysis techniques, including the highly regarded Quasi-Steady-State Photoconductance (QSSPC) lifetime measurement method developed by Sinton Instruments in 1994.
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The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low-lifetime samples. This method complements the use of the transient photoconductance technique that is also standard on this instrument.
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The QSSPC lifetime measurement also yields the implied open-circuit voltage (versus illumination) curve, which is comparable to an I-V curve at each stage of a solar cell process.

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WCT System Capabilities
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Primary application:
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Step-by-step monitoring and optimization of a fabrication process.
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Other applications:
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chart for WCT-120 instrument
Sinton Instruments' analysis yields a calibrated carrier injection level for each wafer, so you can interpret lifetime data in a physically precise way. Specific parameters of interest are displayed and logged for each measurement.

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Monitoring initial material quality
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Detecting heavy metals contamination during wafer processing
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Evaluating surface passivation and emitter dopant diffusion
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Evaluating process-induced shunting using the implied I-V measurement
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Further Information
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For key features, specifications, and additional information, download the WCT-120 product note (PDF - 563k).

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