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BLS/BCT
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WCT-120
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WCT-120TS
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WCT-120PL
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Suns-Voc
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WCT-120/ SunsVoc Signal Connector Box
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FCT-450
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FCT-750
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FMT-350
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IL-800
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  Sinton Instruments — Our Products

     
thumbnail photo of BLS/BCT instrument BLS/BCT   BLS/BCT<empty>: Bulk Silicon Characterization
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Measure lifetime of bulk material prior to sawing with no surface preparation. Accurate measurement of bulk properties in both low- and high-lifetime material.
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thumbnail photo of WCT-120 WCT-120   WCT-120: The Standard R&D Wafer-Lifetime Tool
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Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity.
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thumbnail photo of Suns-Voc instrument Suns-Voc   Suns-Voc: Post-Diffusion Process Control
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Perfect for paste-firing optimization and process control. Open-circuit method indicates the upper bound of efficiency for any solar cell precursors.
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FCT-450   FCT-450: Light I-V Testing for Solar Cells
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Advanced analysis of solar cells including light I-V and Suns-Voc data. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
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photo of FCT-750   FCT-750: In-Line Light I-V Testing for Solar Cells
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In-line, light I-V and Suns-Voc measurements in a single flash at
2400 units per hour. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
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photo of FMT-350 Flash Module Tester FMT-350   FMT-350: Flash Module Tester
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Measures any crystalline silicon module, including high- capacitance, high-effciency modules, using patented electronic-load technology. Results include Suns-Voc and I-V curves. Over 1 GW of product tested to date. Also ideal for R&D.
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thumbnail photo of WCT-120 WCT-120TS   WCT-120PL: Wafer Lifetime Measurement with Photoluminescence Detector
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Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence method.
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thumbnail photo of WCT-120 WCT-120TS   WCT-120TS: Temperature Dependent Lifetime Measurement
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Wafer measurement instrument offering calibrated analysis of
temperature-dependent carrier-recombination lifetime.
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thumbnail photo of WCT-IL800 IL-800   IL-800: Inline Wafer Testing
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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link to FMT-350 product page   Concentrator and Custom IV Test Equipment
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If you would like more information on concentrator and custom IV test equipment, please send us an inquiry.
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      Production Lifetime-Test Instruments
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      WCT-120   IL-800   BCT   BLS    
  Wafer optimized                
  Bulk silicon optimized                
  Automated mapping                    
  In-line production tool                  
  Relative cost ($$$$)   $   $$$   $   $$    
  Configuration   table-top   mounted
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  hand-held   hand-held    
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      Cell and Module Flash Test Instruments for IV Curves
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      FMT   FCT   CCT        
  Conventional cells                
  Backside contact cells      
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  Modules                  
  0.2-1.2X                
  1-20X                  
  20-1000x                    
  Sample size   1.5 x 1 m   up to 156 mm   125 mm        
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      Suns-Voc Wafer Testing to Optimize Metallization Process
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  Wafers with junctions                  
  Monitor metallization                  
  Monitor firing sequence                  
  Small grained polysilicon                  
  Non-silicon materials                  
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