Sinton Instruments logoIndustry Leading Technology for Silicon PV Process Control
<empty>
  About Sinton Instruments
Sinton Instruments Products
Frequently asked questions
Sinton Instruments publications
Contact Us
gradient at bottom of navigation buttons

Shock absorbing, retracting pads that conform to ingot curvature enable the BLS-I to measure any surface of as-grown or shaped ingots description of WCT-120
 
BLS-I/BCT-400 — Superior Bulk Silicon Characterization

<empty>
photo of BLS/BCT instrument

Simple and accurate contactless measurement of true bulk lifetimes on as-grown or shaped silicon. Complies with SEMI Standard PV-13.
<empty>
Product Overview
thin yellow rule
<empty>
The BLS-I and BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
<empty>
Since lifetime measurements are among the most sensitive techniques for characterizing growth and contamination defects, these tools allow you to assess silicon quality directly after growth.
<empty>
For the flexibility to measure all surface types (from 150-mm diameter to flat) choose the BLS-I. For a compact tool designed to measure only flat surfaces, choose the BCT-400.

<empty>

 
 
 
System Capabilities
thin yellow rule
<empty>
Primary applications:
<empty>
<empty>
 
Sinton Instruments BLS/BCT chart 1
Example 1. A transient measurement of an n-type ingot with a lifetime of 8 ms.

larger view
<empty>
example 2 of BLS/BCT data
<empty>Example 2. P-type multicrystalline silicon showing the
characteristic variation of lifetime from the bottom to the top of the brick. Trapping and resistivity profiles are also compiled for each measurement (not shown here)

<empty>
larger view

Qualifying high-purity silicon with lifetimes in the 1–5 millisecond range
<empty>
Qualifying B-Cz silicon as-grown, without special surface preparation
<empty>
Characterizing lifetime and trap density in multicrystalline blocks
<empty>
<empty>
Other applications:

<empty>
<empty>
Detecting B-O defects, Fe contamination, and surface damage
<empty>
Monitoring initial material quality in Cz, FZ, multicrystalline, or UMG silicon
<empty>

Further Information
thin yellow rule
<empty>
For key features, specifications, and additional information, download the BLS/BCT product note (PDF - 803k).

Request a quote
<empty>

<empty> <empty> <empty>
 
      home<empty> | <empty>about<empty> | <empty>products<empty> | <empty>FAQs<empty> | <empty>publications<empty> | <empty>contact us  
           
      © 2009-2014 Sinton Consulting Inc. DBA Sinton Instruments<empty> | <empty>Website design: McHale Creative    
<empty> <empty> <empty> <empty> <empty>
Sinton logo link to home page